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Query: COMUNICATION" Repository: 30 Year: 2010 Language: Español Document Type: Tesis

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Title: Teorías para el cálculo del espesor crítico y la deformación residual
Author: González Robledo, David
Language: Español
Repository: 30
Subject: Intercaras semiconductoras / crecimiento epitaxial / Espesor crítico / deformación residual

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