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Document Type: Conferencia Year: 2020

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Title: Application of a long-rangesweptsource optical coherence tomography-based scheme for dimensional characterization of multilayer transparent objects
Author: Morel, Eneas / Russo, Nélida A. / Torga, Jorge / Duchowicz, A.N.
Language: Inglés
Repository: 54
Subject: UTN / FRD / Optical coherence tomography / Fiber-optic laser / OCT systems

Acceder
Title: Preliminary study of a heterodyne detection system for optical coherence tomography signals
Author: Cusato, Leslie / Morel, Eneas / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Interferometry / Optics Tomography / Dynamic range / Heterodyne Detection / FD-OCT

Acceder
Title: Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
Author: Morel, Eneas / Torga, Jorge
Language: Inglés
Repository: 54
Subject: UTN / FRD / Coherence Interferometry / Michelson-Sagnac configuration

Acceder
Title: Characterization of reference standards for dirt by Laser Ablation Induced Photoacoustics (LAIP)
Author: Orzi, D.J.O / Morel, Eneas / Torga, Jorge / Ravigioni, A.N. / Bilmes, G.M
Language: Inglés
Repository: 54
Subject: UTN / FRD / Laser Ablation / Photoacoustics

Acceder
Title: Ruido Magnético Barkhausen y Emisión Magneto Acústica en probetas de aleación Fe-1 wt % Cu
Author: Gomez, Martín / López Pumarega, Isabel / Torres, Darío / Nuñez, Nicolás / Armeite, María / Ruzzante, José
Language: Español
Repository: 54
Subject: Ruido Barkhausen / Emisiones Magneto Acústica / Microestructurales / Reactores Nucleares / Aceros ferríticos

Acceder
Title: Reduction of measurement errors in OCT scanning
Author: Sallese, Marcelo / Morel, Eneas / Tabla, Pablo / Torga, Jorge
Language: Inglés
Repository: 54
Subject: Optical coherence tomography / Interferometers

Acceder
Title: Determinación del llenado capilar en silicio poroso mediante interferometría de baja coherencia
Author: Sallese, Marcelo / Morel, Eneas / Cencha, Luisa / Budini, Nicolás / Urteaga, Raúl / Torga, Jorge
Language: Español
Repository: 54
Subject: Estructuras nanoporosas / silicio / nanoestructurado / interferometría / óptico / capilar / espectrómetro

Acceder
Title: Caracterización de recubrimientos obtenidos a partir de film líquidos por interferometría de baja coherencia.
Author: Sallese, Marcelo / Morel, Eneas / Lunaa, Georgina / Tabla, Pablo / Torga, Jorge
Language: Español
Repository: 54
Subject: interferometría / poliméricos / barnices / lacas / pinturas / infrarrojo lejano / polimerización o cambios estructurales / topografía

Acceder
Title: Low-coherence interferometry measurement of filling in porous silicon
Author: Sallese, Marcelo / Torga, Jorge / Budini, Nicolás / Urteaga, Raúl
Language: Inglés
Repository: 54
Subject: low-coherence interferometry / porous silicon capillary filling / wet front broadening porosimetry

Acceder
Title: Spectral sensor resolution measurement improvements by temporal analysis
Author: Antonacci, Julian / Morel, Eneas / Torga, Jorge / Duchowicz, Ricardo / Arenas, Gustavo F.
Language: Inglés
Repository: 54
Subject: UTN / FRD / Optical interferometry / Silicon / Spectral analysis / Detectors / Discrete Fourier transforms / Time-domain analysis / Optical fibers

Acceder

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